The gap between lab measurements and real-world applications can lead to suboptimal socket selection and hidden quality risks for customers.
As semiconductor devices continue to advance, the demand for reliable, high-performance test sockets has never been greater.
Traditional socket design validation methods, such as per-pin characterization and generic housing evaluations, often fall short of reflecting true application-specific system-level performance.
Most socket manufacturers use these methods to measure the performance of new sockets, which can limit socket performance insight and lead to suboptimal socket selection and hidden quality risks for customers.
Traditional socket design validation methods often fall short of reflecting true application-specific system-level performance.
Author's summary: Enhancing test socket performance through application-specific validation.